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    ARTICLE

    Explainable Artificial Intelligence-Based Model Drift Detection Applicable to Unsupervised Environments

    Yongsoo Lee, Yeeun Lee, Eungyu Lee, Taejin Lee*

    CMC-Computers, Materials & Continua, Vol.76, No.2, pp. 1701-1719, 2023, DOI:10.32604/cmc.2023.040235 - 30 August 2023

    Abstract Cybersecurity increasingly relies on machine learning (ML) models to respond to and detect attacks. However, the rapidly changing data environment makes model life-cycle management after deployment essential. Real-time detection of drift signals from various threats is fundamental for effectively managing deployed models. However, detecting drift in unsupervised environments can be challenging. This study introduces a novel approach leveraging Shapley additive explanations (SHAP), a widely recognized explainability technique in ML, to address drift detection in unsupervised settings. The proposed method incorporates a range of plots and statistical techniques to enhance drift detection reliability and introduces a… More >

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