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  • Open Access

    ARTICLE

    Modified DS np Chart Using Generalized Multiple Dependent State Sampling under Time Truncated Life Test

    Wimonmas Bamrungsetthapong1, Pramote Charongrattanasakul2,*

    CMES-Computer Modeling in Engineering & Sciences, Vol.138, No.3, pp. 2471-2495, 2024, DOI:10.32604/cmes.2023.031433 - 15 December 2023

    Abstract This study presents the design of a modified attributed control chart based on a double sampling (DS) np chart applied in combination with generalized multiple dependent state (GMDS) sampling to monitor the mean life of the product based on the time truncated life test employing the Weibull distribution. The control chart developed supports the examination of the mean lifespan variation for a particular product in the process of manufacturing. Three control limit levels are used: the warning control limit, inner control limit, and outer control limit. Together, they enhance the capability for variation detection. A genetic… More >

  • Open Access

    ARTICLE

    A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime

    Pramote Charongrattanasakul1, Wimonmas Bamrungsetthapong2,*, Poom Kumam3

    CMC-Computers, Materials & Continua, Vol.73, No.3, pp. 4611-4626, 2022, DOI:10.32604/cmc.2022.030856 - 28 July 2022

    Abstract The design of a new adaptive version of the multiple dependent state (AMDS) sampling plan is presented based on the time truncated life test under the Weibull distribution. We achieved the proposed sampling plan by applying the concept of the double sampling plan and existing multiple dependent state sampling plans. A warning sign for acceptance number was proposed to increase the probability of current lot acceptance. The optimal plan parameters were determined simultaneously with nonlinear optimization problems under the producer’s risk and consumer’s risk. A simulation study was presented to support the proposed sampling plan. More >

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