Linshan Shen1, Ye Tian1,*, Liguo Zhang1,2, Guisheng Yin1, Tong Shuai3, Shuo Liang3, Zhuofei Wu4
CMC-Computers, Materials & Continua, Vol.73, No.1, pp. 465-476, 2022, DOI:10.32604/cmc.2022.027488
- 18 May 2022
Abstract The semi-supervised deep learning technology driven by a small part of labeled data and a large amount of unlabeled data has achieved excellent performance in the field of image processing. However, the existing semi-supervised learning techniques are all carried out under the assumption that the labeled data and the unlabeled data are in the same distribution, and its performance is mainly due to the two being in the same distribution state. When there is out-of-class data in unlabeled data, its performance will be affected. In practical applications, it is difficult to ensure that unlabeled data… More >
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