Dongshi Guan1,2,*
The International Conference on Computational & Experimental Engineering and Sciences, Vol.29, No.1, pp. 1-1, 2024, DOI:10.32604/icces.2024.011291
Abstract Contact line pinning and the corresponding contact angle hysteresis (CAH) are important interfacial phenomena that occur in nature and play a significant role in many industrial processes, such as surface coating, ink-jet printing, and immersion lithography. Traditional optical methods face limitations due to the optical diffraction limit, making it difficult to directly measure flow and interface phenomena at the micro- or nanoscale. However, atomic force microscopy (AFM) offers a solution by enabling precise manipulation and force measurements at micro and nano scales. The AFM-based microrheometer, which is assembled with a long-needle probe, can be used More >
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