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  • Open Access

    ARTICLE

    PAN-DeSpeck: A Lightweight Pyramid and Attention-Based Network for SAR Image Despeckling

    Saima Yasmeen1, Muhammad Usman Yaseen1,*, Syed Sohaib Ali2, Moustafa M. Nasralla3, Sohaib Bin Altaf Khattak3

    CMC-Computers, Materials & Continua, Vol.76, No.3, pp. 3671-3689, 2023, DOI:10.32604/cmc.2023.041195 - 08 October 2023

    Abstract SAR images commonly suffer from speckle noise, posing a significant challenge in their analysis and interpretation. Existing convolutional neural network (CNN) based despeckling methods have shown great performance in removing speckle noise. However, these CNN-based methods have a few limitations. They do not decouple complex background information in a multi-resolution manner. Moreover, they have deep network structures that may result in many parameters, limiting their applicability to mobile devices. Furthermore, extracting key speckle information in the presence of complex background is also a major problem with SAR. The proposed study addresses these limitations by introducing… More >

  • Open Access

    ARTICLE

    An Improved Data-Driven Topology Optimization Method Using Feature Pyramid Networks with Physical Constraints

    Jiaxiang Luo1,2, Yu Li2, Weien Zhou2, Zhiqiang Gong2, Zeyu Zhang1, Wen Yao2,*

    CMES-Computer Modeling in Engineering & Sciences, Vol.128, No.3, pp. 823-848, 2021, DOI:10.32604/cmes.2021.016737 - 11 August 2021

    Abstract Deep learning for topology optimization has been extensively studied to reduce the cost of calculation in recent years. However, the loss function of the above method is mainly based on pixel-wise errors from the image perspective, which cannot embed the physical knowledge of topology optimization. Therefore, this paper presents an improved deep learning model to alleviate the above difficulty effectively. The feature pyramid network (FPN), a kind of deep learning model, is trained to learn the inherent physical law of topology optimization itself, of which the loss function is composed of pixel-wise errors and physical More >

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