Jiaxiang Wang1, Zhengyi Li1, Peng Shi1, Hongying Yu2, Dongbai Sun1,3,*
CMC-Computers, Materials & Continua, Vol.79, No.1, pp. 1187-1204, 2024, DOI:10.32604/cmc.2024.046929
- 25 April 2024
Abstract Scanning electron microscopy (SEM) is a crucial tool in the field of materials science, providing valuable insights into the microstructural characteristics of materials. Unfortunately, SEM images often suffer from blurriness caused by improper hardware calibration or imaging automation errors, which present challenges in analyzing and interpreting material characteristics. Consequently, rectifying the blurring of these images assumes paramount significance to enable subsequent analysis. To address this issue, we introduce a Material Images Deblurring Network (MIDNet) built upon the foundation of the Nonlinear Activation Free Network (NAFNet). MIDNet is meticulously tailored to address the blurring in images… More >