Wimonmas Bamrungsetthapong1, Pramote Charongrattanasakul2,*
CMES-Computer Modeling in Engineering & Sciences, Vol.138, No.3, pp. 2471-2495, 2024, DOI:10.32604/cmes.2023.031433
Abstract This study presents the design of a modified attributed control chart based on a double sampling (DS) np chart applied in combination with generalized multiple dependent state (GMDS) sampling to monitor the mean life of the product based on the time truncated life test employing the Weibull distribution. The control chart developed supports the examination of the mean lifespan variation for a particular product in the process of manufacturing. Three control limit levels are used: the warning control limit, inner control limit, and outer control limit. Together, they enhance the capability for variation detection. A genetic… More >
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