Mudita Uppal1, Deepali Gupta1, Divya Anand2, Fahd S. Alharithi3, Jasem Almotiri3, Arturo Mansilla4,5, Dinesh Singh6, Nitin Goyal1,*
CMC-Computers, Materials & Continua, Vol.72, No.1, pp. 1799-1814, 2022, DOI:10.32604/cmc.2022.025330
- 24 February 2022
Abstract The rapid expansion of Internet of Things (IoT) devices deploys various sensors in different applications like homes, cities and offices. IoT applications depend upon the accuracy of sensor data. So, it is necessary to predict faults in the sensor and isolate their cause. A novel primitive technique named fall curve is presented in this paper which characterizes sensor faults. This technique identifies the faulty sensor and determines the correct working of the sensor. Different sources of sensor faults are explained in detail whereas various faults that occurred in sensor nodes available in IoT devices are… More >
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