Yixin Ding1, Xinjian Zhao1, Zicheng Wu1, Yichen Zhu2, Longkun Bai2, Hao Han2,*
CMC-Computers, Materials & Continua, Vol.84, No.3, pp. 5977-5993, 2025, DOI:10.32604/cmc.2025.065672
- 30 July 2025
Abstract Fuzz testing is a widely adopted technique for uncovering bugs and security vulnerabilities in embedded firmware. However, many embedded systems heavily rely on peripherals, rendering conventional fuzzing techniques ineffective. When peripheral responses are missing or incorrect, fuzzing a firmware may crash or exit prematurely, significantly limiting code coverage. While prior re-hosting approaches have made progress in simulating Memory-Mapped Input/Output (MMIO) and interrupt-based peripherals, they either ignore Direct Memory Access (DMA) or handle it oversimplified. In this work, we present ADFEmu, a novel automated firmware re-hosting framework that enables effective fuzzing of DMA-enabled firmware. ADFEmu integrates… More >
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