Wuqin Tang, Qiang Yang, Wenjun Yan*
CMES-Computer Modeling in Engineering & Sciences, Vol.130, No.3, pp. 1423-1439, 2022, DOI:10.32604/cmes.2022.018313
- 30 December 2021
Abstract Defects detection with Electroluminescence (EL) image for photovoltaic (PV) module has become a standard test procedure during the process of production, installation, and operation of solar modules. There are some typical defects types, such as crack, finger interruption, that can be recognized with high accuracy. However, due to the complexity of EL images and the limitation of the dataset, it is hard to label all types of defects during the inspection process. The unknown or unlabeled create significant difficulties in the practical application of the automatic defects detection technique. To address the problem, we proposed… More >
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