Dan Givoli1
CMES-Computer Modeling in Engineering & Sciences, Vol.5, No.6, pp. 497-514, 2004, DOI:10.3970/cmes.2004.005.497
Abstract Very thin layers with material properties which significantly differ from those of the surrounding medium appear in a variety of applications. Traditionally there are two extreme ways of handling such layers in finite element analysis: either they are fully modelled or they are totally ignored. The former option is often very expensive computationally, while the latter may lead to significant inaccuracies. Here a special technique of modeling thin layers is devised within the framework of the finite element method. This technique constitutes a prudent compromise between the two extremes mentioned above. The layer is replaced More >
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