Yongze Cao1, Guojian Li1, Qiang Wang1,2, Xiaoguang Wang3, Jiaojiao Du1, Jicheng He1
CMC-Computers, Materials & Continua, Vol.37, No.3, pp. 195-203, 2013, DOI:10.3970/cmc.2013.037.195
Abstract The Fe60Ni40 (in atomic %) polycrystalline thin films with 90 nm thickness were prepared on 200 °C quartz substrate by using molecular beam vapor deposition method. The influence of 0 T and 6 T magnetic fields on the structural evolution and magnetic properties of thin films was studied by using EDXS, XRD, AFM and VSM. In this study, only α phase was formed in both thin films. It was found that the application of a 6 T magnetic field obviously decreases the RMS of surface roughness and the grain size. For the magnetic properties of the More >
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