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  • Open Access

    ARTICLE

    STPGTN–A Multi-Branch Parameters Identification Method Considering Spatial Constraints and Transient Measurement Data

    Shuai Zhang, Liguo Weng*

    CMES-Computer Modeling in Engineering & Sciences, Vol.136, No.3, pp. 2635-2654, 2023, DOI:10.32604/cmes.2023.025405 - 09 March 2023

    Abstract Transmission line (TL) Parameter Identification (PI) method plays an essential role in the transmission system. The existing PI methods usually have two limitations: (1) These methods only model for single TL, and can not consider the topology connection of multiple branches for simultaneous identification. (2) Transient bad data is ignored by methods, and the random selection of terminal section data may cause the distortion of PI and have serious consequences. Therefore, a multi-task PI model considering multiple TLs’ spatial constraints and massive electrical section data is proposed in this paper. The Graph Attention Network module More > Graphic Abstract

    STPGTN–A Multi-Branch Parameters Identification Method Considering Spatial Constraints and Transient Measurement Data

  • Open Access

    ARTICLE

    A Universal BIST Approach for Virtex-Ultrascale Architecture

    N. Sathiabama1,*, S. Anila2

    Computer Systems Science and Engineering, Vol.45, No.3, pp. 2705-2720, 2023, DOI:10.32604/csse.2023.025941 - 21 December 2022

    Abstract Interconnected cells, Configurable Logic Blocks (CLBs), and input/output (I/O) pads are all present in every Field Programmable Gate Array (FPGA) structure. The interconnects are formed by the physical paths for connecting the blocks . The combinational and sequential circuits are used in the logic blocks to execute logical functions. The FPGA includes two different tests called interconnect testing and logical testing. Instead of using an additional circuitry, the Built-in-Self-Test (BIST) logic is coded into an FPGA, which is then reconfigured to perform its specific operation after the testing is completed. As a result, additional test… More >

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