Kechen Song^1,2,*, Wenqi Cui², Han Yu¹, Xingjie Li¹, Yunhui Yan^2,*

CMC-Computers, Materials & Continua, Vol.78, No.3, pp. 3953-3969, 2024, DOI:10.32604/cmc.2024.048451 - 26 March 2024

Abstract Segment Anything Model (SAM) is a cutting-edge model that has shown impressive performance in general object segmentation. The birth of the segment anything is a groundbreaking step towards creating a universal intelligent model. Due to its superior performance in general object segmentation, it quickly gained attention and interest. This makes SAM particularly attractive in industrial surface defect segmentation, especially for complex industrial scenes with limited training data. However, its segmentation ability for specific industrial scenes remains unknown. Therefore, in this work, we select three representative and complex industrial surface defect detection scenarios, namely strip steel More >

Xuelong Wu¹, Junsheng Wang^1,*, Zhongyao Li¹, Yisheng Miao¹, Chengpeng Xue¹, Yuling Lang², Decai Kong², Xiaoying Ma², Haibao Qiao²

CMC-Computers, Materials & Continua, Vol.78, No.3, pp. 3703-3720, 2024, DOI:10.32604/cmc.2024.047027 - 26 March 2024

Abstract X-ray Computed Tomography (XCT) enables non-destructive acquisition of the internal structure of materials, and image segmentation plays a crucial role in analyzing material XCT images. This paper proposes an image segmentation method based on the Segment Anything model (SAM). We constructed a dataset of carbide in nickel-based single crystal superalloys XCT images and preprocessed the images using median filtering, histogram equalization, and gamma correction. Subsequently, SAM was fine-tuned to adapt to the task of material XCT image segmentation, resulting in Material-SAM. We compared the performance of threshold segmentation, SAM, U-Net model, and Material-SAM. Our method More >