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    ARTICLE

    Reliability Analysis of HEE Parameters via Progressive Type-II Censoring with Applications

    Heba S. Mohammed1, Mazen Nassar2,3, Refah Alotaibi1, Ahmed Elshahhat4,*

    CMES-Computer Modeling in Engineering & Sciences, Vol.137, No.3, pp. 2761-2793, 2023, DOI:10.32604/cmes.2023.028826 - 03 August 2023

    Abstract A new extended exponential lifetime model called Harris extended-exponential (HEE) distribution for data modelling with increasing and decreasing hazard rate shapes has been considered. In the reliability context, researchers prefer to use censoring plans to collect data in order to achieve a compromise between total test time and/or test sample size. So, this study considers both maximum likelihood and Bayesian estimates of the Harris extended-exponential distribution parameters and some of its reliability indices using a progressive Type-II censoring strategy. Under the premise of independent gamma priors, the Bayesian estimation is created using the squared-error and… More >

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