Taeshik Yoon1,†, Sumin Kang1,†, Tae Yeob Kang1, Taek-Soo Kim1,2,*
CMES-Computer Modeling in Engineering & Sciences, Vol.120, No.2, pp. 351-361, 2019, DOI:10.32604/cmes.2019.06672
Abstract Detection of cracks is a great concern in production and operation processes of graphene based devices to ensure uniform quality. Here, we show a detection method for graphene cracks by electromagnetic induction. The time varying magnetic field leads to induced voltage signals on graphene, and the signals are detected by a voltmeter. The measured level of induced voltage is correlated with the number of cracks in graphene positively. The correlation is attributed to the increasing inductive characteristic of defective graphene, and it is verified by electromagnetic simulation and radio frequency analysis. Furthermore, we demonstrate that More >
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