S. Patala1, C.A. Schuh1
CMC-Computers, Materials & Continua, Vol.17, No.1, pp. 1-18, 2010, DOI:10.3970/cmc.2010.017.001
Abstract Recent advances in microstructural characterization have made it possible to measure grain boundaries and their networks in full crystallographic detail. Statistical studies of the complete boundary space using full crystallographic parameters (misorientations and boundary plane inclinations) are limited because the topology of the parameter space is not understood (especially for homophase grain boundaries). This paper addresses some of the complexities associated with the group space of grain boundaries, and resolves the topology of the complete boundary space for systems of two-dimensional crystals. Although the space of homophase boundaries is complicated by the existence of a… More >
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