Bo Xiao1, Zhen Wang2, Qi Liu3,*, Xiaodong Liu3
CMC-Computers, Materials & Continua, Vol.56, No.3, pp. 365-379, 2018, DOI:10.3970/cmc.2018.01830
Abstract In recent years, the rapid development of big data technology has also been favored by more and more scholars. Massive data storage and calculation problems have also been solved. At the same time, outlier detection problems in mass data have also come along with it. Therefore, more research work has been devoted to the problem of outlier detection in big data. However, the existing available methods have high computation time, the improved algorithm of outlier detection is presented, which has higher performance to detect outlier. In this paper, an improved algorithm is proposed. The SMK-means More >
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