Pramote Charongrattanasakul¹, Wimonmas Bamrungsetthapong^2,*, Poom Kumam³

Computer Systems Science and Engineering, Vol.46, No.2, pp. 1631-1651, 2023, DOI:10.32604/csse.2023.036179 - 09 February 2023

Abstract A novel adaptive multiple dependent state sampling plan (AMDSSP) was designed to inspect products from a continuous manufacturing process under the accelerated life test (ALT) using both double sampling plan (DSP) and multiple dependent state sampling plan (MDSSP) concepts. Under accelerated conditions, the lifetime of a product follows the Weibull distribution with a known shape parameter, while the scale parameter can be determined using the acceleration factor (AF). The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive. An economic design of the proposed sampling plan was also considered for the… More >

Mustafa Kamal^*

CMES-Computer Modeling in Engineering & Sciences, Vol.130, No.3, pp. 1239-1269, 2022, DOI:10.32604/cmes.2022.017532 - 30 December 2021

Abstract In general, simple subsystems like series or parallel are integrated to produce a complex hybrid system. The reliability of a system is determined by the reliability of its constituent components. It is often extremely difficult or impossible to get specific information about the component that caused the system to fail. Unknown failure causes are instances in which the actual cause of system failure is unknown. On the other side, thanks to current advanced technology based on computers, automation, and simulation, products have become incredibly dependable and trustworthy, and as a result, obtaining failure data for… More >

Rashad Bantan¹, Amal S. Hassan², Ehab Almetwally³, M. Elgarhy⁴, Farrukh Jamal⁵, Christophe Chesneau⁶, Mahmoud Elsehetry^7,*

CMC-Computers, Materials & Continua, Vol.68, No.3, pp. 2859-2875, 2021, DOI:10.32604/cmc.2021.015422 - 06 May 2021

Abstract Accelerated life testing has been widely used in product life testing experiments because it can quickly provide information on the lifetime distributions by testing products or materials at higher than basic conditional levels of stress, such as pressure, temperature, vibration, voltage, or load to induce early failures. In this paper, a step stress partially accelerated life test (SS-PALT) is regarded under the progressive type-II censored data with random removals. The removals from the test are considered to have the binomial distribution. The life times of the testing items are assumed to follow length-biased weighted Lomax… More >