Open Access

ARTICLE

Determination of insecticide resistance in four populations of potato psillid Bactericera cockerelli (Sulc.) (Hemiptera: Triozidae)

by Cerna E, Y Ochoa, LA Aguirre, M Flores, J Landeros

Universidad Autónoma Agraria Antonio Narro. Departamento de Parasitología. Buenavista, Saltillo, Coahuila, México. C.P. 25315.

* Corresponding Author:Address Correspondence to: Dra. Yisa María Ochoa Fuentes. Universidad Autónoma Agraria Antonio Narro, Calzada Antonio Narro No 1923, CP 25315, Saltillo, Coahuila, México. Tel.: (844) 11 02 26, e-mail:

Phyton-International Journal of Experimental Botany 2013, 82(all), 63-68. https://doi.org/10.32604/phyton.2013.82.063

Abstract

Southeastern potato growing regions from Coahuila and Nuevo León contribute with 15% to domestic production. Such production has been impacted by several factors, in particular Bactericera (=Paratrioza) cockerelli Sulc potato psyllid, one of the most important pests affecting this crop. Its control is based on Insecticide applications, leading to unsatisfactory results and high selection pressure. Five insecticides were evaluated in four field populations of B. cockerelli from the growing region, using a susceptible laboratory line for comparison. The field populations were collected from greenhouse and commercial orchards located at Huachichil, Saltillo, Raíces and San Rafael localities. All the samples were taken to the toxicology laboratory of Antonio Narro Autonomous University, where a series of biological essays were conducted through foliar dipping, in order to determine the CL₅₀ levels, confidence limits and resistance levels as compared to the susceptible laboratory line. The Huachichil’s population did not exceed the resistance ratio (10X) in any insecticide Population without resistance problems. Saltillo and Raices populations exceed the resistance ratio with values of 20.4 and 29.3 times respectively, for the insecticide imidachloprid, and San Rafael population showed values 11.7 times for the insecticide endosulphan, above the resistance threshold.

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