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Analysis of the Impact Resistance of Photovoltaic Panels Based on the Effective Thickness Method

Jian Gong1, Lingzhi Xie1,2,*, Yongxue Li1, Zhichun Ni3, Qingzhu Wei3, Yupeng Wu4, Haonan Cheng5

1 College of Architecture and Environment, Sichuan University, Chengdu, 610065, China
2 Institute of New Energy and Low-Carbon Technology, Sichuan University, Chengdu, 610207, China
3 Suzhou Talesun Solar Technologies Co., Ltd., Suzhou, 215542, China
4 Department of Architecture and Built Environment, Faculty of Engineering, University of Nottingham, University Park, Nottingham, NG7 2RD, UK
5 National Photovoltaic Product Quality Supervision and Inspection Center, Chengdu, 610065, China

* Corresponding Author: Lingzhi Xie. Email: email

TSP_JRM_16262.pdf

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