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Theoretical Implementation of All-Optical XOR Gate at 160 Gb/s Using Semiconductor Optical Amplifiers-Based Turbo-Switched Mach-Zehnder Interferometer
Amer Kotba,b,*, Chunlei Guoaa,c,*
a
The Guo China-US Photonics Laboratory, Changchun Institute of Optics, Fine Mechanics, and Physics, Chinese Academy of Sciences, Changchun 130033, China
b
Department of Physics, Faculty of Science, University of Fayoum, Fayoum 63514, Egypt
c
The Institute of Optics, University of Rochester, Rochester, NY 14627, US
*
Correspondence Authors, E-mails: amer@ciomp.ac.cn (Amer Kotb); guo@optics.rochester.edu (Chunlei Guo)
Journal of Advanced Optics and Photonics 2018, 1(4), 263-278. https://doi.org/10.32604/jaop.2019.04960
Abstract
The implantation of an all-optical eXclusive-OR (XOR) gate run at 160 Gb/s using semiconductor optical amplifiers (SOAs)-based turbo-switched Mach-Zehnder interferometer (TS-MZI) is theoretically investigated and verified. The dependence of the quality factor (QF) on the signal and SOA key operating parameters is examined and assessed, including the impact of amplified spontaneous emission in order to obtain realistic results. A higher QF is obtained when using SOAs-based TS-MZI than when using conventional SOAs-based MZI.
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APA Style
Kotb, A., Guoa, C. (2018). Theoretical implementation of all-optical XOR gate at 160 gb/s using semiconductor optical amplifiers-based turbo-switched mach-zehnder interferometer. Journal of Advanced Optics and Photonics, 1(4), 263-278. https://doi.org/10.32604/jaop.2019.04960
Vancouver Style
Kotb A, Guoa C. Theoretical implementation of all-optical XOR gate at 160 gb/s using semiconductor optical amplifiers-based turbo-switched mach-zehnder interferometer. J Adv Opt Photon . 2018;1(4):263-278 https://doi.org/10.32604/jaop.2019.04960
IEEE Style
A. Kotb and C. Guoa, “Theoretical Implementation of All-Optical XOR Gate at 160 Gb/s Using Semiconductor Optical Amplifiers-Based Turbo-Switched Mach-Zehnder Interferometer,” J. Adv. Opt. Photon. , vol. 1, no. 4, pp. 263-278, 2018. https://doi.org/10.32604/jaop.2019.04960
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Copyright © 2018 The Author(s). Published by Tech Science Press.
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