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ABSTRACT

Phase Field Simulation of Stress Evolution during Grain Growth Process

by T. Uehara1, M. Fukui2, N. Ohno3

Dept. Comput. Sci. Eng., Nagoya Univ., Chikusa-ku, Nagoya 464-8603, Japan
Graduate Student, Nagoya Univ., Japan
Nagoya Univ., Japan

The International Conference on Computational & Experimental Engineering and Sciences 2007, 2(3), 61-66. https://doi.org/10.3970/icces.2007.002.061

Abstract

Stress evolution during grain growth in microstructure formation process are simulated by using the phase field model. Fundamental equations accounting for the coupling effects among phase transformation, temperature and stress/strain have been formulated based on thermodynamical laws, in which thermal expansion, transformation dilatation, and stress dependency on phase transformation are considered. An elasto-plastic constitutive relationship is applied so as to obtain the residual stresses. Based on these equations, numerical simulations are carried out by the finite element method. Results for two kinds of initial arrangement of nuclei are demonstrated in this paper. One model has four nuclei at the four corners of a square model resulting in cross-shaped grain boundaries, while another has nine internal nuclei incorporating polycrystalline structure. For both models, large stresses are generated at phase interfaces in the early stage when precipitated phase grow freely. Then remarkably higher stresses are observed at grain boundaries when grain collision occurs. The high-stress regions move as grains grow, and finally residual stress distribution along the grain boundaries is observed.

Cite This Article

APA Style
Uehara, T., Fukui, M., Ohno, N. (2007). Phase field simulation of stress evolution during grain growth process. The International Conference on Computational & Experimental Engineering and Sciences, 2(3), 61-66. https://doi.org/10.3970/icces.2007.002.061
Vancouver Style
Uehara T, Fukui M, Ohno N. Phase field simulation of stress evolution during grain growth process. Int Conf Comput Exp Eng Sciences . 2007;2(3):61-66 https://doi.org/10.3970/icces.2007.002.061
IEEE Style
T. Uehara, M. Fukui, and N. Ohno, “Phase Field Simulation of Stress Evolution during Grain Growth Process,” Int. Conf. Comput. Exp. Eng. Sciences , vol. 2, no. 3, pp. 61-66, 2007. https://doi.org/10.3970/icces.2007.002.061



cc Copyright © 2007 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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