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Explore Wetting Dynamics at Micro and Nano Scales: Applications and Progress of Long-Needle Atomic Force Microscope

Dongshi Guan^1,2,*

1 State Key Laboratory of Nonlinear Mechanics, Institute of Mechanics, Chinese Academy of Sciences, Beijing, 100190, China

* Corresponding Author: Dongshi Guan. Email:

The International Conference on Computational & Experimental Engineering and Sciences 2024, 29(1), 1-1. https://doi.org/10.32604/icces.2024.011291

Abstract

Contact line pinning and the corresponding contact angle hysteresis (CAH) are important interfacial phenomena that occur in nature and play a significant role in many industrial processes, such as surface coating, ink-jet printing, and immersion lithography. Traditional optical methods face limitations due to the optical diffraction limit, making it difficult to directly measure flow and interface phenomena at the micro- or nanoscale. However, atomic force microscopy (AFM) offers a solution by enabling precise manipulation and force measurements at micro and nano scales. The AFM-based microrheometer, which is assembled with a long-needle probe, can be used to study the dynamics of the gas-liquid-solid three-phase contact line and the micro- and nanoscale flow near the non-ideal fluid-solid interface. In this presentation, the experimental principles and methods of long-needle AFM will be reviewed, along with its latest progress in the study of wetting dynamics at micro- and nanoscale [1-4]. This experimental method provides reliable data for testing various theoretical models and numerical simulations. The application of this technology in emerging fields may inspire us to explore the physical nature of complex phenomena at interfaces.

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