Table of Content

Open Access iconOpen Access

ABSTRACT

Phase Retrieval in Coherent Optical Metrology

Y. H. Huang, S. Y. Hung, Y. S. Liu, Y. Y. Hung

The International Conference on Computational & Experimental Engineering and Sciences 2011, 20(1), 1-2. https://doi.org/10.3970/icces.2011.020.001

Abstract

Coherent optical metrology represents a broad scope of techniques using coherent or partial coherent light as a probing matter for various measurements including refractive index, deformation, 3D shape, velocity, temperature, pressure etc. Phase retrieval places a central role in various coherent techniques such as optical nondestructive testing (NDT), surface plasmon resonance (SPR) optical biosensors, laser Doppler vibrometry (LDV), digital holography, optical coherence tomography (OCT) and spectral phase interferometry for direct electric-field reconstruction (SPIDER). Different phase retrieval schemes have been applied in different applications to meet their specific requirements. This article tends to provide a brief review and comparison on various phase retrieval methods in terms of principles, accuracy, robustness, applicability and requirements. Emphasis will be given on possible adoption of various phase retrieval techniques for applications in experimental mechanics for deformation measurement, vibration characterization and material evaluation. Recently advances in high speed wide-range dynamic measurement using speckle interferometry will also be emphasized.

Cite This Article

APA Style
Huang, Y.H., Hung, S.Y., Liu, Y.S., Hung, Y.Y. (2011). Phase retrieval in coherent optical metrology. The International Conference on Computational & Experimental Engineering and Sciences, 20(1), 1-2. https://doi.org/10.3970/icces.2011.020.001
Vancouver Style
Huang YH, Hung SY, Liu YS, Hung YY. Phase retrieval in coherent optical metrology. Int Conf Comput Exp Eng Sciences . 2011;20(1):1-2 https://doi.org/10.3970/icces.2011.020.001
IEEE Style
Y.H. Huang, S.Y. Hung, Y.S. Liu, and Y.Y. Hung, “Phase Retrieval in Coherent Optical Metrology,” Int. Conf. Comput. Exp. Eng. Sciences , vol. 20, no. 1, pp. 1-2, 2011. https://doi.org/10.3970/icces.2011.020.001



cc Copyright © 2011 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
  • 1232

    View

  • 821

    Download

  • 0

    Like

Share Link