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ABSTRACT

The Theory of Critical Distances and the estimation of notch fatigue limits: L, a0 and open notches

by L. Susmel1, D. Taylor2, R. Tovo1

Department of Engineering, University of Ferrara, Via Saragat, 1 – 44100 Ferrara, Italy
Department of Mechanical Engineering, Trinity College, Dublin 2, Ireland

The International Conference on Computational & Experimental Engineering and Sciences 2007, 1(2), 81-86. https://doi.org/10.3970/icces.2007.001.081

Abstract

This paper investigates some practical aspects related to the use of the Theory of Critical Distances (TCD) when employed to estimate notch fatigue limits. The accuracy of different formalisations of the theory was checked by using experimental data taken from the literature. This exercise allowed us to confirm that the simplest formalisation of the TCD, in which both critical distance and critical stress are material constants [1], is also the most accurate one, giving predictions falling within an error interval of about ±20%. The TCD is also accurate when applied to notches having large opening angles.

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APA Style
Susmel, L., Taylor, D., Tovo, R. (2007). The theory of critical distances and the estimation of notch fatigue limits: L, a0 and open notches. The International Conference on Computational & Experimental Engineering and Sciences, 1(2), 81-86. https://doi.org/10.3970/icces.2007.001.081
Vancouver Style
Susmel L, Taylor D, Tovo R. The theory of critical distances and the estimation of notch fatigue limits: L, a0 and open notches. Int Conf Comput Exp Eng Sciences . 2007;1(2):81-86 https://doi.org/10.3970/icces.2007.001.081
IEEE Style
L. Susmel, D. Taylor, and R. Tovo, “The Theory of Critical Distances and the estimation of notch fatigue limits: L, a0 and open notches,” Int. Conf. Comput. Exp. Eng. Sciences , vol. 1, no. 2, pp. 81-86, 2007. https://doi.org/10.3970/icces.2007.001.081



cc Copyright © 2007 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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