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ABSTRACT
Structure-resolved properties of nanomaterials probed by in-situ TEM
The International Conference on Computational & Experimental Engineering and Sciences 2011, 18(3), 73-74. https://doi.org/10.3970/icces.2011.018.073
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The in-situ transmission electron microscopy (TEM) method has been developed to probe the novel properties of nanomateials. It is powerful in a way that it can directly correlate the microstructure of the nanomaterials with their physical properties for the same nanoscale sample. In this talk, I will report on the construction and applications of a home-made in-situ TEM platform for nanomanipulation and nanomeasurements.Mechanics and electromechanical coupling of individual nanowires have been studied inside TEM. The mechanism of resistance switching effects of nanoscale ionic conductors has been revealed by in-situ TEM high-resolution observation. And the transport properties of carbon nanotubes and graphene will be also included in this talk.
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APA Style
Bai, X. (2011). Structure-resolved properties of nanomaterials probed by in-situ TEM. The International Conference on Computational & Experimental Engineering and Sciences, 18(3), 73-74. https://doi.org/10.3970/icces.2011.018.073
Vancouver Style
Bai X. Structure-resolved properties of nanomaterials probed by in-situ TEM. Int Conf Comput Exp Eng Sciences . 2011;18(3):73-74 https://doi.org/10.3970/icces.2011.018.073
IEEE Style
X. Bai, “Structure-resolved properties of nanomaterials probed by in-situ TEM,” Int. Conf. Comput. Exp. Eng. Sciences , vol. 18, no. 3, pp. 73-74, 2011. https://doi.org/10.3970/icces.2011.018.073
Copyright © 2011 The Author(s). Published by Tech Science Press.This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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