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ABSTRACT
The localization / delocalization dilemma in the electronic structure of d- and f- element oxides
The International Conference on Computational & Experimental Engineering and Sciences 2011, 17(4), 123-124. https://doi.org/10.3970/icces.2011.017.123
Abstract
The electronic structure of many of the oxides containing d- and f-elements has long been a challenge for theory. For example, the traditional workhorses of density functional theory, the local density approximation (LDA) and the generalized gradient approximations (GGA), predict most of these systems to be metallic, when in fact they are insulators with band gaps of several eV. These problems reflect the localization/delocalization dilemma faced in systems with weak overlap and seem to be largely overcome by the new generation of hybrid density functionals developed for molecular studies. Only recently has it been possible to apply these functionals to solids but in the cases studied thus far we find a distinct improvement. The hybrid functionals predict the correct insulating ground state, band gap, lattice constant and magnetic behavior at 0K, where known. I will review the origin of the problem, how hybrid functionals differ from traditional ones, and recent applications to MnO, CeO2, Ce2O3, and the actinide oxide series AnO2, An = Th ... Es.Cite This Article
APA Style
L.Martin, R. (2011). The localization / delocalization dilemma in the electronic structure of d- and f- element oxides. The International Conference on Computational & Experimental Engineering and Sciences, 17(4), 123-124. https://doi.org/10.3970/icces.2011.017.123
Vancouver Style
L.Martin R. The localization / delocalization dilemma in the electronic structure of d- and f- element oxides. Int Conf Comput Exp Eng Sciences . 2011;17(4):123-124 https://doi.org/10.3970/icces.2011.017.123
IEEE Style
R. L.Martin, “The localization / delocalization dilemma in the electronic structure of d- and f- element oxides,” Int. Conf. Comput. Exp. Eng. Sciences , vol. 17, no. 4, pp. 123-124, 2011. https://doi.org/10.3970/icces.2011.017.123
Copyright © 2011 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.