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ABSTRACT

Experimental/numerical analysis on the thermal-induced warpage of ultra-thin chip-on-flex (UTCOF) interconnects

Su-Tsai Lu1,2, Wen-Hwa Chen1

Dept. of Power Mechanical Engineering, National TsingHua University, Taiwan, R.O.C.
2 Electronics and Optoelectronics Research Laboratories, ITRI, Taiwan, R.O.C. Email: kirkirlu@itri.org.tw

TSP_ICCES_47.pdf

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