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Feature Selection Using Artificial Immune Network: An Approach for Software Defect Prediction

Bushra Mumtaz1, Summrina Kanwal2,*, Sultan Alamri2, Faiza Khan1

1 Faculty of Computing, Riphah International University, Islamabad, 45211, Pakistan
2 Department of Computing and Informatics, Saudi Electronic University, Riyadh, 11673, Saudi Arabia

* Corresponding Author: Summrina Kanwal. Email: email

Intelligent Automation & Soft Computing 2021, 29(3), 669-684. https://doi.org/10.32604/iasc.2021.018405

Abstract

Software Defect Prediction (SDP) is a dynamic research field in the software industry. A quality software product results in customer satisfaction. However, the higher the number of user requirements, the more complex will be the software, with a correspondingly higher probability of failure. SDP is a challenging task requiring smart algorithms that can estimate the quality of a software component before it is handed over to the end-user. In this paper, we propose a hybrid approach to address this particular issue. Our approach combines the feature selection capability of the Optimized Artificial Immune Networks (Opt-aiNet) algorithm with benchmark machine-learning classifiers for the better detection of bugs in software modules. Our proposed methodology was tested and validated using 5 open-source National Aeronautics and Space Administration (NASA) data sets from the PROMISE repository: CM1, KC2, JM1, KC1 and PC1. Results were reported in terms of accuracy level and of an AUC with highest accuracy, namely, 94.82%. The results of our experiments indicate that the detection capability of benchmark classifiers can be improved by incorporating Opt-aiNet as a feature selection (FS) method.

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APA Style
Mumtaz, B., Kanwal, S., Alamri, S., Khan, F. (2021). Feature selection using artificial immune network: an approach for software defect prediction. Intelligent Automation & Soft Computing, 29(3), 669-684. https://doi.org/10.32604/iasc.2021.018405
Vancouver Style
Mumtaz B, Kanwal S, Alamri S, Khan F. Feature selection using artificial immune network: an approach for software defect prediction. Intell Automat Soft Comput . 2021;29(3):669-684 https://doi.org/10.32604/iasc.2021.018405
IEEE Style
B. Mumtaz, S. Kanwal, S. Alamri, and F. Khan, “Feature Selection Using Artificial Immune Network: An Approach for Software Defect Prediction,” Intell. Automat. Soft Comput. , vol. 29, no. 3, pp. 669-684, 2021. https://doi.org/10.32604/iasc.2021.018405

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cc Copyright © 2021 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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