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Multi-Focus Image Region Fusion and Registration Algorithm with Multi-Scale Wavelet

by Hai Liu1,*, Xiangchao Zhou2,3

1 Guangdong Polytechnic of Science and Technology, Guangzhou, 510663, China
2 Hunan Agricultural University, Changsha, 410125, China
3 Shenzhen Intelligent Sichuang Technology Co., Ltd., Shenzhen, 518015, China

* Corresponding Author: Hai Liu. Email: email

Intelligent Automation & Soft Computing 2020, 26(6), 1493-1501. https://doi.org/10.32604/iasc.2020.012159

Abstract

Aiming at the problems of poor brightness control effect and low registration accuracy in traditional multi focus image registration, a wavelet multi-scale multi focus image region fusion registration method is proposed. The multi-scale Retinex algorithm is used to enhance the image, the wavelet decomposition similarity analysis is used for image interpolation, and the EMD method is used to decompose the multi focus image. Finally, the image reconstruction is completed and the multi focus image registration is realized. In order to verify the multi focus image fusion registration effect of different methods, a comparative experiment was designed. Experimental results show that the proposed method can control the image brightness in a reasonable range, the root mean square error of image region fusion registration algorithm is less than 5, and the image registration accuracy is high. This method can achieve multi focus image region fusion registration.

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APA Style
Liu, H., Zhou, X. (2020). Multi-focus image region fusion and registration algorithm with multi-scale wavelet. Intelligent Automation & Soft Computing, 26(6), 1493-1501. https://doi.org/10.32604/iasc.2020.012159
Vancouver Style
Liu H, Zhou X. Multi-focus image region fusion and registration algorithm with multi-scale wavelet. Intell Automat Soft Comput . 2020;26(6):1493-1501 https://doi.org/10.32604/iasc.2020.012159
IEEE Style
H. Liu and X. Zhou, “Multi-Focus Image Region Fusion and Registration Algorithm with Multi-Scale Wavelet,” Intell. Automat. Soft Comput. , vol. 26, no. 6, pp. 1493-1501, 2020. https://doi.org/10.32604/iasc.2020.012159

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cc Copyright © 2020 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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