Open Access

ARTICLE

Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW

Nan Pan¹, Yi Liu², Dilin Pan², Junbing Qian¹, Gang Li³

1 Faculty of Civil Aviation and Aeronautical, Kunming University of Science & Technology, Kunming 650500, P.R. China
2 Kunming SNLab Tech Co., Ltd., Kunming 650228, P.R. China
3 Institute of Forensic science, Shijiazhuang Public Security Bureau, Shijiazhuang 050021, P.R. China

* Corresponding Author: Nan Pan,