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A Distributed Heterogeneous Inspection System for High Performance Inline Surface Defect Detection

Yu-Cheng Chou1, Wei-Chieh Liao2, Yan-Liang Chen2, Ming Chang2, Po Ting Lin3

1 Institute of Undersea Technology, National Sun Yat-sen University, Kaohsiung, Taiwan
2 Department of Mechanical Engineering, Chung Yuan Christian University, Taoyuan, Taiwan
3 Department of Mechanical Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan

* Corresponding Author: Yu-Cheng Chou,

Intelligent Automation & Soft Computing 2019, 25(1), 79-90.


This paper presents the Distributed Heterogeneous Inspection System (DHIS), which comprises two CUDA workstations and is equipped with CPU distributed computing, CPU concurrent computing, and GPU concurrent computing functions. Thirty-two grayscale images, each with 5,000× 12,288 pixels and simulated defect patterns, were created to evaluate the performances of three system configurations: (1) DHIS; (2) two CUDA workstations with CPU distributed computing and GPU concurrent computing; (3) one CUDA workstation with GPU concurrent computing. Experimental results indicated that: (1) only DHIS can satisfy the time limit, and the average turnaround time of DHIS is 37.65% of the time limit; (2) a good linear relationship exists between the processing speed ratio and the instruction sequence quantity ratio.


Cite This Article

Y. Chou, . W. Liao, . Y. Chen, . M. Chang and . P. T. Lin, "A distributed heterogeneous inspection system for high performance inline surface defect detection," Intelligent Automation & Soft Computing, vol. 25, no.1, pp. 79–90, 2019.

This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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