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Correction: Micro-Locational Fine Dust Prediction Utilizing Machine Learning and Deep Learning Models

by Seoyun Kim1,#, Hyerim Yu2,#, Jeewoo Yoon1,3, Eunil Park1,2,*

1 Department of Applied Artificial Intelligence, Sungkyunkwan University, Seoul, 03063, Korea
2 Department of Human-Artificial Intelligence Interaction, Sungkyunkwan University, Seoul, 03063, Korea
3 AI Team, Raon Data, Seoul, 03073, Korea
* Corresponding Author: Eunil Park. Email: eunilpark@skku.edu
# These two authors contributed equally to this work

Computer Systems Science and Engineering 2024, 48(3), 861-861. https://doi.org/10.32604/csse.2024.053659

This article is a correction of:

Micro-Locational Fine Dust Prediction Utilizing Machine Learning and Deep Learning Models
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Abstract

This article has no abstract.

In the article “Micro-Locational Fine Dust Prediction Utilizing Machine Learning and Deep Learning Models” by Seoyun Kim, Hyerim Yu, Jeewoo Yoon, Eunil Park (Computer Systems Science and Engineering, 2024, Vol. 48, No. 2, pp. 413–429. DOI: 10.32604/csse.2023.041575), The following references [36] is irrelevant to the topic.

The authors wish to apologize for any inconvenience caused due to the fact that the cited reference is irrelevant to the topic. Please check the following updates,

Original Content/Reference:

1. Delete reference [36]

36. S. Hwang, H. Ahn and E. Park, “iMovieRec: A hybrid movie recommendation method based on a user-image-item model,” International Journal of Machine Learning and Cybernetics, vol. 14, pp. 1–12, 2023.

2. Delete content referencing Reference [36] in the main text:

RMSE (formula (6)) is the square root of mean squared error (MSE) which mitigates the distortion resulting from MSE [36]. MAE (formula (7)) is the mean of the absolute variances between the observed and estimated values [37].

Based on the employed metrics and the findings of prior research [38–42], the RMSE and Pearson correlation are mainly considered our main metrics. Table 6 and Fig. 6 summarize the results.

The authors state that the scientific conclusions are unaffected. This correction was approved by the Computer Systems Science and Engineering Editorial Office. The original publication has also been updated.


Cite This Article

APA Style
Kim, S., Yu, H., Yoon, J., Park, E. (2024). Correction: micro-locational fine dust prediction utilizing machine learning and deep learning models. Computer Systems Science and Engineering, 48(3), 861-861. https://doi.org/10.32604/csse.2024.053659
Vancouver Style
Kim S, Yu H, Yoon J, Park E. Correction: micro-locational fine dust prediction utilizing machine learning and deep learning models. Comput Syst Sci Eng. 2024;48(3):861-861 https://doi.org/10.32604/csse.2024.053659
IEEE Style
S. Kim, H. Yu, J. Yoon, and E. Park, “Correction: Micro-Locational Fine Dust Prediction Utilizing Machine Learning and Deep Learning Models,” Comput. Syst. Sci. Eng., vol. 48, no. 3, pp. 861-861, 2024. https://doi.org/10.32604/csse.2024.053659


cc Copyright © 2024 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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