Open Access

ARTICLE

Novel Metrics for Mutation Analysis

Savas Takan^1,*, Gokmen Katipoglu²

1 Ankara University, Ankara, 06100, Turkey
2 Kafkas University, Kars, 36100, Turkey

* Corresponding Author: Savas Takan. Email:

Computer Systems Science and Engineering 2023, 46(2), 2075-2089. https://doi.org/10.32604/csse.2023.036791

Received 12 October 2022; Accepted 08 December 2022; Issue published 09 February 2023

Abstract

A measure of the “goodness” or efficiency of the test suite is used to determine the proficiency of a test suite. The appropriateness of the test suite is determined through mutation analysis. Several Finite State Machine (FSM) mutants are produced in mutation analysis by injecting errors against hypotheses. These mutants serve as test subjects for the test suite (TS). The effectiveness of the test suite is proportional to the number of eliminated mutants. The most effective test suite is the one that removes the most significant number of mutants at the optimal time. It is difficult to determine the fault detection ratio of the system. Because it is difficult to identify the system’s potential flaws precisely. In mutation testing, the Fault Detection Ratio (FDR) metric is currently used to express the adequacy of a test suite. However, there are some issues with this metric. If both test suites have the same defect detection rate, the smaller of the two tests is preferred. The test case (TC) is affected by the same issue. The smaller two test cases with identical performance are assumed to have superior performance. Another difficulty involves time. The performance of numerous vehicles claiming to have a perfect mutant capture time is problematic. Our study developed three metrics to address these issues: , , and In this context, most used test generation tools were examined and tested using the developed metrics. Thanks to the metrics we have developed, the research contributes to eliminating the problems related to performance measurement by integrating the missing parameters into the system.

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Keywords

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