Open Access

ARTICLE

Defect Prediction Using Akaike and Bayesian Information Criterion

Saleh Albahli^1,*, Ghulam Nabi Ahmad Hassan Yar²

1 Department of Information Technology, College of Computer, Qassim University, Buraydah, Saudi Arabia
2 Department of Electrical and Computer Engineering, Air University, Islamabad, Pakistan

* Corresponding Author: Saleh Albahli. Email: