Open Access

ARTICLE

YOLO-RLC: An Advanced Target-Detection Algorithm for Surface Defects of Printed Circuit Boards Based on YOLOv5

Yuanyuan Wang^1,2,*, Jialong Huang¹, Md Sharid Kayes Dipu¹, Hu Zhao³, Shangbing Gao^1,2, Haiyan Zhang^1,2, Pinrong Lv¹

1 School of Computer and Software Engineering, Huaiyin Institute of Technology, Huai’an, 223003, China
2 Huaiyin Institute of Technology, Laboratory for Internet of Things and Mobile Internet Technology of Jiangsu Province, Huai’an, 223001, China
3 Jiangsu Kesheng Xuanyi Technology Co., Ltd., Huai’an, 223300, China

* Corresponding Author: Yuanyuan Wang. Email: