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Automated X-ray Defect Inspection on Occluded BGA Balls Using Hybrid Algorithm

Ki-Yeol Eom1, Byungseok Min2,*

1 Department of AI Bigdata, Suseong University, Daegu, 42078, Korea
2 R&D Center, XAVIS Co., Ltd., Seongnam-si, 13202, Korea

* Corresponding Author: Byungseok Min. Email: email

TSP_CMC_35336.pdf

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