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A Defect Detection Method for the Primary Stage of Software Development

Qiang Zhi1, Wanxu Pu1, Jianguo Ren1, Zhengshu Zhou2,*

1 School of Computer Science and Technology, Jiangsu Normal University, Xuzhou, 221116, China
2 Graduate School of Informatics, Nagoya University, Nagoya, 4648601, Japan

* Corresponding Author: Zhengshu Zhou. Email: email

Computers, Materials & Continua 2023, 74(3), 5141-5155. https://doi.org/10.32604/cmc.2023.035846

Abstract

In the early stage of software development, a software requirements specification (SRS) is essential, and whether the requirements are clear and explicit is the key. However, due to various reasons, there may be a large number of misunderstandings. To generate high-quality software requirements specifications, numerous researchers have developed a variety of ways to improve the quality of SRS. In this paper, we propose a questions extraction method based on SRS elements decomposition, which evaluates the quality of SRS in the form of numerical indicators. The proposed method not only evaluates the quality of SRSs but also helps in the detection of defects, especially the description problem and omission defects in SRSs. To verify the effectiveness of the proposed method, we conducted a controlled experiment to compare the ability of checklist-based review (CBR) and the proposed method in the SRS review. The CBR is a classic method of reviewing SRS defects. After a lot of practice and improvement for a long time, CBR has excellent review ability in improving the quality of software requirements specifications. The experimental results with 40 graduate students majoring in software engineering confirmed the effectiveness and advantages of the proposed method. However, the shortcomings and deficiencies of the proposed method are also observed through the experiment. Furthermore, the proposed method has been tried out by engineers with practical work experience in software development industry and received good feedback.

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APA Style
Zhi, Q., Pu, W., Ren, J., Zhou, Z. (2023). A defect detection method for the primary stage of software development. Computers, Materials & Continua, 74(3), 5141-5155. https://doi.org/10.32604/cmc.2023.035846
Vancouver Style
Zhi Q, Pu W, Ren J, Zhou Z. A defect detection method for the primary stage of software development. Comput Mater Contin. 2023;74(3):5141-5155 https://doi.org/10.32604/cmc.2023.035846
IEEE Style
Q. Zhi, W. Pu, J. Ren, and Z. Zhou, “A Defect Detection Method for the Primary Stage of Software Development,” Comput. Mater. Contin., vol. 74, no. 3, pp. 5141-5155, 2023. https://doi.org/10.32604/cmc.2023.035846



cc Copyright © 2023 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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