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Two-Fold and Symmetric Repeatability Rates for Comparing Keypoint Detectors

by Ibrahim El rube'*

Department of Computer Engineering, CCIT, Taif University, Taif, 21944, Saudi Arabia

* Corresponding Author: Ibrahim El rube'. Email: email

Computers, Materials & Continua 2022, 73(3), 6495-6511. https://doi.org/10.32604/cmc.2022.031602

Abstract

The repeatability rate is an important measure for evaluating and comparing the performance of keypoint detectors. Several repeatability rate measurements were used in the literature to assess the effectiveness of keypoint detectors. While these repeatability rates are calculated for pairs of images, the general assumption is that the reference image is often known and unchanging compared to other images in the same dataset. So, these rates are asymmetrical as they require calculations in only one direction. In addition, the image domain in which these computations take place substantially affects their values. The presented scatter diagram plots illustrate how these directional repeatability rates vary in relation to the size of the neighboring region in each pair of images. Therefore, both directional repeatability rates for the same image pair must be included when comparing different keypoint detectors. This paper, firstly, examines several commonly utilized repeatability rate measures for keypoint detector evaluations. The researcher then suggests computing a two-fold repeatability rate to assess keypoint detector performance on similar scene images. Next, the symmetric mean repeatability rate metric is computed using the given two-fold repeatability rates. Finally, these measurements are validated using well-known keypoint detectors on different image groups with various geometric and photometric attributes.

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Cite This Article

APA Style
rube', I.E. (2022). Two-fold and symmetric repeatability rates for comparing keypoint detectors. Computers, Materials & Continua, 73(3), 6495-6511. https://doi.org/10.32604/cmc.2022.031602
Vancouver Style
rube' IE. Two-fold and symmetric repeatability rates for comparing keypoint detectors. Comput Mater Contin. 2022;73(3):6495-6511 https://doi.org/10.32604/cmc.2022.031602
IEEE Style
I. E. rube', “Two-Fold and Symmetric Repeatability Rates for Comparing Keypoint Detectors,” Comput. Mater. Contin., vol. 73, no. 3, pp. 6495-6511, 2022. https://doi.org/10.32604/cmc.2022.031602



cc Copyright © 2022 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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