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A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime

by Pramote Charongrattanasakul1, Wimonmas Bamrungsetthapong2,*, Poom Kumam3

1 Division of Mathematics, Department of Mathematics and Computer Science, Faculty of Science and Technology, Rajamangala University of Technology Krungthep, Bangkok, 10120, Thailand
2 Division of Applied Statistics, Department of Mathematics and Computer Science, Faculty of Science and Technology, Rajamangala University of Technology Thanyaburi, Pathum Thani, 12110, Thailand
3 Center of Excellence in Theoretical and Computational Science (TaCS-CoE) & KMUTT Fixed Point Research Laboratory, Room SCL 802 Fixed Point Laboratory, Science Laboratory Building, Departments of Mathematics, Faculty of Science, King Mongkut’s University of Technology Thonburi (KMUTT), Bangkok, 10140, Thailand

* Corresponding Author: Wimonmas Bamrungsetthapong. Email: email

Computers, Materials & Continua 2022, 73(3), 4611-4626. https://doi.org/10.32604/cmc.2022.030856

Abstract

The design of a new adaptive version of the multiple dependent state (AMDS) sampling plan is presented based on the time truncated life test under the Weibull distribution. We achieved the proposed sampling plan by applying the concept of the double sampling plan and existing multiple dependent state sampling plans. A warning sign for acceptance number was proposed to increase the probability of current lot acceptance. The optimal plan parameters were determined simultaneously with nonlinear optimization problems under the producer’s risk and consumer’s risk. A simulation study was presented to support the proposed sampling plan. A comparison between the proposed and existing sampling plans, namely multiple dependent state (MDS) sampling plans and a modified multiple dependent state (MMDS) sampling plan, was considered under the average sampling number and operating characteristic curve values. In addition, the use of two real datasets demonstrated the practicality and usefulness of the proposed sampling plan. The results indicated that the proposed plan is more flexible and efficient in terms of the average sample number compared to the existing MDS and MMDS sampling plans.

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Cite This Article

APA Style
Charongrattanasakul, P., Bamrungsetthapong, W., Kumam, P. (2022). A novel multiple dependent state sampling plan based on time truncated life tests using mean lifetime. Computers, Materials & Continua, 73(3), 4611-4626. https://doi.org/10.32604/cmc.2022.030856
Vancouver Style
Charongrattanasakul P, Bamrungsetthapong W, Kumam P. A novel multiple dependent state sampling plan based on time truncated life tests using mean lifetime. Comput Mater Contin. 2022;73(3):4611-4626 https://doi.org/10.32604/cmc.2022.030856
IEEE Style
P. Charongrattanasakul, W. Bamrungsetthapong, and P. Kumam, “A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime,” Comput. Mater. Contin., vol. 73, no. 3, pp. 4611-4626, 2022. https://doi.org/10.32604/cmc.2022.030856



cc Copyright © 2022 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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