Open Access
ARTICLE
Crop Yield Prediction Using Machine Learning Approaches on a Wide Spectrum
1 Department of Electronics and Communication Engineering, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Chennai, 600062, India
2 Department of Electrical and Electronics Engineering, Sri Venkateswara College of Engineering, Sriperumbudur, 602117, India
3 Suranaree University of Technology, Nakhon Ratchasima, 30000, Thailand
4 University of Central Punjab, Lahore, 54000, Pakistan
5 Government College University, Lahore, 54000, Pakistan
6 Virtual University of Pakistan, Islamabad Campus, 45550, Pakistan
* Corresponding Author: Worawat Lawanont. Email: