Open Access

ARTICLE

Algorithmic Scheme for Concurrent Detection and Classification of Printed Circuit Board Defects

Jakkrit Onshaunjit, Jakkree Srinonchat^*

Faculty of Engineering, Rajamangala University of Technology Thanyaburi (Main Campus), Khlong Luang, Pathum Thani, 12110, Thailand

* Corresponding Author: Jakkree Srinonchat. Email: