%0 Journal Article %A Surendran, R. %A Khalaf, Osamah-Ibrahim %A Romero, Carlos-Andres-Tavera %D 2022 %J Computers, Materials \& Continua %@ 1546-2226 %V 70 %N 3 %P 6323--6338 %T Deep Learning Based Intelligent Industrial Fault Diagnosis Model %M doi:10.32604/cmc.2022.021716 %U http://www.techscience.com/cmc/v70n3/45030