Open Access iconOpen Access

ARTICLE

crossmark

Analysis and Characterization of Normally-Off Gallium Nitride High Electron Mobility Transistors

Shahzaib Anwar1, Sardar Muhammad Gulfam1,*, Bilal Muhammad2, Syed Junaid Nawaz1, Khursheed Aurangzeb3, Mohammad Kaleem1

1 Department of Electrical and Computer Engineering, COMSATS University Islamabad (CUI), Islamabad, 45550, Pakistan
2 CTIF Global Capsule, Department of Business Development and Technology, Aarhus University, 7400, Herning, Denmark
3 Computer Engineering Department, College of Computer and Information Sciences, King Saud University, Riyadh, 11543, Saudi Arabia

* Corresponding Author: Sardar Muhammad Gulfam. Email: email

TSP_CMC_18248.pdf

  • 2569

    View

  • 1963

    Download

  • 0

    Like

Share Link