Open Access

ARTICLE

Within-Project and Cross-Project Software Defect Prediction Based on Improved Transfer Naive Bayes Algorithm

Kun Zhu¹, Nana Zhang¹, Shi Ying^{1, *}, Xu Wang²

1 School of Computer Science, Wuhan University, Wuhan, 430072, China.
2 Department of Computer Science, Vrije University Amsterdam, Amsterdam, 1081HV, The Netherlands.

* Corresponding Author: Shi Ying. Email: .