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On Harmonic and Ev-Degree Molecular Topological Properties of DOX, RTOX and DSL Networks

Murat Cancan1, *

Faculty of Education, Van Yüzüncü Yıl University, Van 65080, Turkey.

* Corresponding Author: Murat Cancan. Email: email.

Computers, Materials & Continua 2019, 59(3), 777-786. https://doi.org/10.32604/cmc.2019.06596

Abstract

Topological indices enable to gather information for the underlying topology of chemical structures and networks. Novel harmonic indices have been defined recently. All degree based topological indices are defined by using the classical degree concept. Recently two novel degree concept have been defined in graph theory: ve-degree and ev-degree. Ve-degree Zagreb indices have been defined by using ve-degree concept. The prediction power of the ve-degree Zagreb indices is stronger than the classical Zagreb indices. Dominating oxide, silicate and oxygen networks are important network models in view of chemistry, physics and information science. Physical and mathematical properties of dominating oxide, silicate and oxygen networks have been considerably studied in graph theory and network theory. Topological properties of the dominating oxide, silicate and oxygen networks have been intensively investigated for the last few years period. In this study we examined, the first, the fifth harmonic and ev-degree topological indices of dominating oxide (DOX), regular triangulene oxide network (RTOX) and dominating silicate network (DSL).

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Cite This Article

APA Style
Cancan, M. (2019). On harmonic and ev-degree molecular topological properties of DOX, RTOX and DSL networks. Computers, Materials & Continua, 59(3), 777-786. https://doi.org/10.32604/cmc.2019.06596
Vancouver Style
Cancan M. On harmonic and ev-degree molecular topological properties of DOX, RTOX and DSL networks. Comput Mater Contin. 2019;59(3):777-786 https://doi.org/10.32604/cmc.2019.06596
IEEE Style
M. Cancan, “On Harmonic and Ev-Degree Molecular Topological Properties of DOX, RTOX and DSL Networks,” Comput. Mater. Contin., vol. 59, no. 3, pp. 777-786, 2019. https://doi.org/10.32604/cmc.2019.06596



cc Copyright © 2019 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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