Binary Image Steganalysis Based on Distortion Level Co-Occurrence Matrix
Junjia Chen1, Wei Lu1,2,*, Yuileong Yeung1, Yingjie Xue1, Xianjin Liu1, Cong Lin1,3, Yue Zhang4
CMC-Computers, Materials & Continua, Vol.55, No.2, pp. 201-211, 2018, DOI:10.3970/cmc.2018.01781
Abstract In recent years, binary image steganography has developed so rapidly that the research of binary image steganalysis becomes more important for information security. In most state-of-the-art binary image steganographic schemes, they always find out the flippable pixels to minimize the embedding distortions. For this reason, the stego images generated by the previous schemes maintain visual quality and it is hard for steganalyzer to capture the embedding trace in spacial domain. However, the distortion maps can be calculated for cover and stego images and the difference between them is significant. In this paper, a novel binary More >