Open Access

ARTICLE

Fast and High-Resolution Optical Inspection System for In-Line Detection and Labeling of Surface Defects

M. Chang^1,2,3, Y. C. Chou^1,2, P. T. Lin^1,2, J. L. Gabayno^2,4

1 Department of Mechanical Engineering, Chung Yuan Christian University, Chung Li, Taoyuan, Taiwan 32023.
2 Center for Biomedical Technology, Chung Yuan Christian University, Chung Li, Taoyuan, Taiwan32023.
3 The State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China 430074.
4 Mapua Institute of Technology, Muralla St., Intramuros, 1002 Manila, Philippines.