%0 Journal Article %A Chang, M. %A Chou, Y.-C. %A Lin, P.-T. %A Gabayno, J.-L. %D 2014 %J Computers, Materials \& Continua %@ 1546-2226 %V 42 %N 2 %P 125--140 %T Fast and High-Resolution Optical Inspection System for In-Line Detection and Labeling of Surface Defects %M doi:10.3970/cmc.2014.042.125 %U http://www.techscience.com/cmc/v42n2/22756